Invention Grant
- Patent Title: Sensor apparatus for measurement of material properties
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Application No.: US14396580Application Date: 2013-05-29
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Publication No.: US09863893B2Publication Date: 2018-01-09
- Inventor: Praful Sharma , Manoj Kumar Koyithitta Meethal , Aparna Chakrapani Sheila-Vadde , Suma Memana Narayana Bhat , Vipin Velayudhan
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Agent Laura L. Pollander
- Priority: IN2174/CHE/2012 20120530
- International Application: PCT/US2013/042955 WO 20130529
- International Announcement: WO2013/181173 WO 20131205
- Main IPC: G01N22/00
- IPC: G01N22/00 ; G01R27/06 ; G01R27/04 ; G01R27/02

Abstract:
A material constituent sensor includes one or more metamaterial assisted antennas located to probe a material that is a multiphase composition. A signal source excites at least one metamaterial assisted antenna in a desired range of radio frequency (RF) signals, a desired range of microwave signals, or a combination RF signals and microwave signals. A data processing device is programmed to estimate material constituent fractions associated with the probed material based on amplitude data, phase data, frequency shift data, or a combination of amplitude data, phase data and frequency shift data in response to transmitted energy from at least one excited metamaterial assisted antenna, reflected energy received by at least one metamaterial assisted antenna, frequency shift data, or a combination of the transmitted energy, the reflected energy and the frequency shift.
Public/Granted literature
- US20150097579A1 SENSOR APPARATUS FOR MEASUREMENT OF MATERIAL PROPERTIES Public/Granted day:2015-04-09
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