Invention Grant
- Patent Title: Planar sensor array for non-destructive evaluation of material using electromagnetic impedance
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Application No.: US14605597Application Date: 2015-01-26
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Publication No.: US09863900B2Publication Date: 2018-01-09
- Inventor: Sarah E. Pluta , Donald D. Colosimo , John W. Hewitt
- Applicant: TransTech Systems, Inc.
- Applicant Address: US NY Latham
- Assignee: TransTech Systems, Inc.
- Current Assignee: TransTech Systems, Inc.
- Current Assignee Address: US NY Latham
- Agency: Hoffman Warnick LLC
- Main IPC: G01R25/00
- IPC: G01R25/00 ; G01N27/02

Abstract:
Various embodiments include planar sensor arrays for use in determining characteristics of a material under test (MUT). The planar sensor arrays can include a set of electrodes positioned to enhance a depth and clarity of detection into the material under test. Some embodiments include an electromagnetic sensor array having: a first set of two rectilinear electrodes, positioned opposed to one another across a space; and a second set of two rectilinear electrodes, positioned opposed to one another across the space, the second set being off-set from the first set, wherein the first set and the second set are configured to detect an electromagnetic impedance of the MUT.
Public/Granted literature
- US20150212026A1 PLANAR SENSOR ARRAY FOR NON-DESTRUCTIVE EVALUATION OF MATERIAL USING ELECTROMAGNETIC IMPEDANCE Public/Granted day:2015-07-30
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