Invention Grant
- Patent Title: Sample analyzer, sample analyzing method, and program determining data end points used to calculate target material concentration
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Application No.: US15142905Application Date: 2016-04-29
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Publication No.: US09863964B2Publication Date: 2018-01-09
- Inventor: Naoto Koshimura
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2015-096043 20150508
- Main IPC: G01N33/86
- IPC: G01N33/86 ; G01N21/82 ; G01N35/00 ; G01N21/27 ; G01N21/77

Abstract:
Disclosed is a sample analyzer configured to analyze a concentration of a target material contained in a sample based on a value representing a slope of a regression line which is based on data values included in an interval from a start point to an endpoint. The start point is detected by a predetermined method and the endpoint is detected by a predetermined method.
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Information query
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