Invention Grant
- Patent Title: Mismatch detection using replica circuit
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Application No.: US15341955Application Date: 2016-11-02
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Publication No.: US09864000B2Publication Date: 2018-01-09
- Inventor: Dan William Nobbe , Ronald Eugene Reedy , Peter Bacon , James S. Cable
- Applicant: Peregrine Semiconductor Corporation
- Applicant Address: US CA San Diego
- Assignee: Peregrine Semiconductor Corporation
- Current Assignee: Peregrine Semiconductor Corporation
- Current Assignee Address: US CA San Diego
- Agency: Jaquez Land Greenhaus LLP
- Agent Martin J. Jaquez, Esq.; Alessandro Steinfl, Esq.
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/28 ; H03F1/56 ; H03F3/213 ; H03F3/195 ; H03F1/02 ; H03F1/22 ; H03F3/193 ; H03F3/21 ; H03F3/24 ; H03F3/72 ; H03H7/38 ; H04B1/44 ; H04B17/11

Abstract:
An apparatus for detecting difference in operating characteristics of a main circuit by using a replica circuit is presented. In one exemplary case, a sensed difference in operating characteristics of the two circuits is used to drive a tuning control loop to minimize the sensed difference. In another exemplary case, several replica circuits of the main circuit are used, where each is isolated from one or more operating variables that affect the operating characteristic of the main circuit. Each replica circuit can be used for sensing a different operating characteristic, or, two replica circuits can be combined to sense a same operating characteristic.
Public/Granted literature
- US20170146591A1 Mismatch Detection Using Replica Circuit Public/Granted day:2017-05-25
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