Invention Grant
- Patent Title: Scheme applied into electronic device and capable of measuring resistance parameter(s) associated with battery cell
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Application No.: US14617949Application Date: 2015-02-10
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Publication No.: US09864015B2Publication Date: 2018-01-09
- Inventor: Jui-Chi Wu , Chi-Ming Lee , Kai-Hsun Chou
- Applicant: MEDIATEK INC.
- Applicant Address: TW Hsin-Chu
- Assignee: MEDIATEK INC.
- Current Assignee: MEDIATEK INC.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: G01R31/36
- IPC: G01R31/36
Abstract:
A method applied into an electronic device and capable of measuring at least one resistance parameter includes: launching a program/application on the electronic device; and using the program/application to measure the at least one resistance parameter that is at least associated with a battery cell connected to and used for providing power to the electronic device.
Public/Granted literature
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