Invention Grant
- Patent Title: Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector
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Application No.: US14289336Application Date: 2014-05-28
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Publication No.: US09864075B2Publication Date: 2018-01-09
- Inventor: Jonathan Giencke
- Applicant: Bruker AXS, Inc.
- Agency: Benoît & Côté Inc.
- Main IPC: G01T1/29
- IPC: G01T1/29 ; G01B9/10 ; G01B15/00 ; G01N23/20 ; G01N15/02 ; G01N23/207 ; G01B9/02 ; G01N21/84

Abstract:
A method for performing an X-ray diffraction analysis of a crystal sample using a multi-dimensional detector that integrates an X-ray diffraction signal while the position of the sample relative to an X-ray source is changed along a scan direction. The resulting image is compressed along the scan direction, but may be collected very quickly. The capture of both on-axis and off-axis reflections in a single image provides a common spatial frame of reference for comparing the reflections. This may be used in the construction of a reciprocal space map, and is useful for analyzing a sample with multiple crystal layers, such as a crystal substrate with a crystalline film deposited thereupon.
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