Invention Grant
- Patent Title: Spin transfer MRAM device with reduced coefficient of MTJ resistance variation
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Application No.: US15217148Application Date: 2016-07-22
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Publication No.: US09865321B2Publication Date: 2018-01-09
- Inventor: Yimin Guo
- Applicant: Headway Technologies, Inc.
- Applicant Address: US CA Milpitas
- Assignee: Headway Technologies, Inc.
- Current Assignee: Headway Technologies, Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Saile Ackerman LLC
- Agent Stephen B. Ackerman
- Main IPC: G11C11/16
- IPC: G11C11/16

Abstract:
We describe the manufacturing process for and structure of a CPP MTJ MRAM unit cell that utilizes transfer of spin angular momentum as a mechanism for changing the magnetic moment direction of a free layer. The cell is formed of a vertically or horizontally series connected sequence of N sub-cells, each sub-cell being an identical MTJ element. A statistical population of such multiple sub-cell unit cells has a variation of resistance that is less by a factor of N−1/2 than that of a population of single sub-cells. As a result, such unit cells have an improved read margin while not requiring an increase in the critical switching current.
Public/Granted literature
- US20160329087A1 Spin Transfer MRAM Device with Reduced Coefficient of MTJ Resistance Variation Public/Granted day:2016-11-10
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