Invention Grant
- Patent Title: Burn-in memory testing
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Application No.: US14920696Application Date: 2015-10-22
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Publication No.: US09865360B2Publication Date: 2018-01-09
- Inventor: Eran Sharon , Alexander Bazarsky , Ariel Navon , Alon Eyal , Idan Alrod , Ofer Shapira
- Applicant: SANDISK TECHNOLOGIES INC.
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Plano
- Agency: Toler Law Group, PC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/38 ; G11C29/44

Abstract:
A method performed by a controller includes initiating a first data write operation and an erase operation on a portion of a non-volatile memory. The first data write operation corresponds to a first write resolution. The method includes initiating a second data write operation to write test data to the portion of the non-volatile memory. The second data write operation corresponds to a second write resolution that is greater than the first write resolution. The method also includes reading a representation of the test data from the portion of the non-volatile memory.
Public/Granted literature
- US20170117061A1 BURN-IN MEMORY TESTING Public/Granted day:2017-04-27
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