Invention Grant
- Patent Title: Apparatus and method for determining the location of plate elements of a wafer boat
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Application No.: US13642891Application Date: 2011-04-27
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Publication No.: US09865485B2Publication Date: 2018-01-09
- Inventor: Daniel Knopfle , Andreas Hartmann , Ottmar Graf
- Applicant: Daniel Knopfle , Andreas Hartmann , Ottmar Graf
- Applicant Address: DE
- Assignee: CENTROTHERM PHOTOVOLTAICS AG
- Current Assignee: CENTROTHERM PHOTOVOLTAICS AG
- Current Assignee Address: DE
- Agency: Tarolli, Sundheim, Covell & Tummino LLP
- Priority: DE102010018465 20100427
- International Application: PCT/EP2011/002115 WO 20110427
- International Announcement: WO2011/134653 WO 20111103
- Main IPC: H01L21/67
- IPC: H01L21/67

Abstract:
An apparatus and method determines the location of wafer boat plate elements having a plurality of plate elements arranged substantially parallel to each other. At least three sensors are moved along travel paths perpendicular to the plate elements, wherein at least a first travel path is above, at least a second travel path is below the wafer boat and at third travel path is laterally spaced from the first or second travel paths above or below the wafer boat. During this movement the position of the sensors along a respective travel path is determined continuously, and it is determined, in which position a respective plate element enters the measuring area of a sensor and exits the same. A distance between a sensor and an edge of a plate element is measured and the location of a respective plate element is determined by means of the sensor signals.
Public/Granted literature
- US20130272825A1 APPARATUS AND METHOD FOR DETERMINING THE LOCATION OF PLATE ELEMENTS OF A WAFER BOAT Public/Granted day:2013-10-17
Information query
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