Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same semiconductor device
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Application No.: US15063187Application Date: 2016-03-07
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Publication No.: US09865502B2Publication Date: 2018-01-09
- Inventor: Kenro Nakamura
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Tokyo
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2015-051406 20150313
- Main IPC: H01L29/40
- IPC: H01L29/40 ; H01L21/768 ; H01L23/48

Abstract:
The semiconductor device includes a semiconductor layer in which a via hole penetrating an upper surface of the semiconductor layer to a lower surface of the semiconductor layer is provided. The semiconductor device includes a first insulating film provided over the lower surface of the semiconductor layer and an inner surface of the via hole. The semiconductor device includes a second insulating film provided over the lower surface of the semiconductor layer and the inner surface of the via hole with the first insulating film interposed between the second insulating film and the semiconductor layer. The semiconductor device includes a device layer including a semiconductor element and provided on the side of the upper surface of the semiconductor layer.
Public/Granted literature
- US09842773B2 Semiconductor device and method of manufacturing the same semiconductor device Public/Granted day:2017-12-12
Information query
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