Invention Grant
- Patent Title: Test circuit to isolate HCI degradation
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Application No.: US15163379Application Date: 2016-05-24
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Publication No.: US09866221B2Publication Date: 2018-01-09
- Inventor: Keith A. Jenkins , Barry P. Linder
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: H03L7/00
- IPC: H03L7/00 ; H03K3/03 ; H03K5/133 ; G01R31/26 ; G01R31/317

Abstract:
Embodiments are directed to a system for synchronizing switching events. The system includes a controller, a clock generator communicatively coupled to the controller and a delay chain communicatively coupled to the controller. The delay chain is configured to perform a plurality of delay chain switching events in response to an input to the delay chain. The controller is configured to initiate a synchronization phase that includes enabling the clock generator to provide as an input to the delay chain a clock generator output at a synchronization frequency, wherein the clock generator output passing through the delay chain synchronizes the plurality of delay chain switching events to occur at the synchronization frequency resulting in a frequency of an output of the delay chain being synchronized to the synchronization frequency of the clock generator output.
Public/Granted literature
- US20170346492A1 TEST CIRCUIT TO ISOLATE HCI DEGRADATION Public/Granted day:2017-11-30
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