Invention Grant
- Patent Title: Optical displacement measurement system, imaging condition optimization method, and imaging condition optimization program
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Application No.: US15046465Application Date: 2016-02-18
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Publication No.: US09866747B2Publication Date: 2018-01-09
- Inventor: Hiroyuki Satoyoshi
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2015-042172 20150304
- Main IPC: H04N5/232
- IPC: H04N5/232 ; H04N5/225 ; G01B11/24 ; H04N5/235 ; G01B11/00 ; G01B11/25

Abstract:
There are provided an optical displacement measurement system, an imaging condition optimization method, and an imaging condition optimization program which facilitate setting of an optimal imaging condition. States of a plurality of imaging parameters for setting an imaging condition are set by an imaging setting unit. When the set state of any of the plurality of imaging parameters is changed, a plurality of pieces captured image data according to respective imaging conditions are generated by a light receiving unit. Profile data indicating a profile shape is generated by a profile generation unit based on each piece of generated captured image data. Based on each piece of generated profile data or captured image data corresponding to the profile data, a degree of reliability of a profile shape indicated by the profile data is calculated by a reliability calculation unit.
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