Masks that selectively attenuate radiation for inspections of printed circuit boards (PCB) are disclosed. A PCB may be inspected for defects by exposing the PCB with radiation and analyzing the radiation transmitted through the PCB. By employing a radiation mask having first and second segments between the PCB and a radiation source, the radiation may be selectively attenuated to attenuate a first portion of the radiation with a first attenuation level to prevent performance degradation to sensitive semiconductor devices as part of a first sectional area of the PCB, and yet provide substantially non-attenuation or attenuation at a second attenuation level for a second portion of the radiation incident upon a second sectional area of the PCB which is free from sensitive semiconductor devices. In this manner, the selective attenuation enables inspection of the first and second sectional areas of the PCB without damage to the sensitive semiconductor devices.