Invention Grant
- Patent Title: Providing known distribution patterns associated with specific measures and metrics
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Application No.: US15364446Application Date: 2016-11-30
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Publication No.: US09881078B2Publication Date: 2018-01-30
- Inventor: Rajesh Radhakrishnan
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran Cole & Calderon P.C.
- Agent Christopher McLane; Andrew M. Calderon
- Main IPC: G06F17/30
- IPC: G06F17/30 ; G06F17/18 ; G06F17/27

Abstract:
A computer receives one or more keywords input by a user to describe a metric or a test and identifies a first document that includes at least one of the keywords. The computer identifies, in the first document, a known distribution pattern and an associated metric or measure that relate to the one or more keywords. The computer makes an electronic record of the identified known distribution pattern and associated metric or measure.
Public/Granted literature
- US20170083618A1 PROVIDING KNOWN DISTRIBUTION PATTERNS ASSOCIATED WITH SPECIFIC MEASURES AND METRICS Public/Granted day:2017-03-23
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