Invention Grant
- Patent Title: Method of growing high quality, thick SiC epitaxial films by eliminating silicon gas phase nucleation and suppressing parasitic deposition
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Application No.: US14360064Application Date: 2012-11-20
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Publication No.: US09885124B2Publication Date: 2018-02-06
- Inventor: Tangali S. Sudarshan , Haizheng Song , Tawhid Rana
- Applicant: UNIVERSITY OF SOUTH CAROLINA
- Applicant Address: US SC Columbia
- Assignee: University of South Carolina
- Current Assignee: University of South Carolina
- Current Assignee Address: US SC Columbia
- Agency: Dority & Manning, PA
- International Application: PCT/US2012/066087 WO 20121120
- International Announcement: WO2013/078219 WO 20130530
- Main IPC: C30B29/36
- IPC: C30B29/36 ; C30B25/18 ; H01L21/02 ; H01L21/306 ; C30B25/14 ; C30B25/16 ; C30B25/20 ; H01L29/16

Abstract:
Methods for forming an epilayer on a surface of a substrate are generally provided. For example, a substrate can be positioned within a hot wall CVD chamber (e.g., onto a susceptor within the CVD chamber). At least two source gases can then be introduced into the hot wall CVD chamber such that, upon decomposition, fluorine atoms, carbon atoms, and silicon atoms are present within the CVD chamber. The epilayer comprising SiC can then be grown on the surface of the substrate in the presence of the fluorine atoms.
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