- Patent Title: Optical inspection station for detecting light-reflecting defects
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Application No.: US12312032Application Date: 2007-10-24
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Publication No.: US09885666B2Publication Date: 2018-02-06
- Inventor: Jean-Francois Garin
- Applicant: Jean-Francois Garin
- Applicant Address: FR Vourles
- Assignee: TIAMA
- Current Assignee: TIAMA
- Current Assignee Address: FR Vourles
- Agency: Clark & Brody
- Priority: FR0654490 20061024
- International Application: PCT/FR2007/052239 WO 20071024
- International Announcement: WO2008/050067 WO 20080502
- Main IPC: H04N9/47
- IPC: H04N9/47 ; G01N21/90 ; G01N21/88

Abstract:
The invention relates to an optical inspection station comprising: an illumination system capable of delivering a series of light beams illuminating an inspection region of the object at various angles of incidence; a camera equipped with a lens for producing images of the inspection region during rotation of the object; and a unit for analyzing and processing the images taken by the camera so as to detect the presence of reflecting defects in the images. According to the invention, the optical inspection station includes a series of optical elements for deflecting, in the air, rays reflected by the inspection region, these being placed between the inspection region and the lens so as to form, in each image, a series of views of the inspection region taken at different angles of viewing.
Public/Granted literature
- US20100128120A1 OPTICAL INSPECTION STATION FOR DETECTING LIGHT-REFLECTING DEFECTS Public/Granted day:2010-05-27
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