Invention Grant
- Patent Title: Gas analysis device
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Application No.: US14004097Application Date: 2012-02-09
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Publication No.: US09885695B2Publication Date: 2018-02-06
- Inventor: Shigeru Nakatani , Kenji Hara , Montajir Rahman , Masahiro Nakane
- Applicant: Shigeru Nakatani , Kenji Hara , Montajir Rahman , Masahiro Nakane
- Applicant Address: JP Kyoto
- Assignee: Horiba, Ltd.
- Current Assignee: Horiba, Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JP2011-052231 20110309
- International Application: PCT/JP2012/052951 WO 20120209
- International Announcement: WO2012/120957 WO 20120913
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N21/3504 ; G01N21/05 ; G01N21/15

Abstract:
In order to be able to prevent analysis accuracy from being reduced by a backward flow of sample gas from dead volume in a cleaning mechanism into a cell at the time of analysis, a gas analysis device has an analysis part that analyzes the sample gas introduced into the cell, gas ports that are arranged toward predetermined regions of gas contact surfaces in the cell, and a piping mechanism that connects the gas ports to a predetermined purge gas source, and blows purge gas from the gas ports toward the predetermined regions at the time of purging. The gas analysis device also has a switching part that switches a connecting destination of the piping mechanism from the purge gas source to a predetermined suction part, and at the time of introducing or analyzing the sample gas, connects the gas ports to the suction source.
Public/Granted literature
- US20140002823A1 GAS ANALYSIS DEVICE Public/Granted day:2014-01-02
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