Invention Grant
- Patent Title: Switching matrix and testing system for semiconductor characteristic measurement using the same
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Application No.: US13425987Application Date: 2012-03-21
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Publication No.: US09885746B2Publication Date: 2018-02-06
- Inventor: Choon Leong Lou , Li Min Wang
- Applicant: Choon Leong Lou , Li Min Wang
- Applicant Address: TW Hsinchu
- Assignee: STAR TECHNOLOGIES, INC.
- Current Assignee: STAR TECHNOLOGIES, INC.
- Current Assignee Address: TW Hsinchu
- Agency: Marquez IP Law Office, PLLC
- Agent Juan Carlos A. Marquez
- Priority: TW100135703A 20111003
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A switching matrix includes a plurality of input ports, a plurality of output ports, a plurality of switching devices configured to open and close, an electrical connection between the input ports and the output ports, and an electrical sensor configured to generate a signal by measuring a predetermined electrical property of the electrical connection, the open and close of switching devices is pre-determined by status read from the electrical sensor.
Public/Granted literature
- US20130082731A1 SWITCHING MATRIX AND TESTING SYSTEM FOR SEMICONDUCTOR CHARACTERISTIC MEASUREMENT USING THE SAME Public/Granted day:2013-04-04
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