Invention Grant
- Patent Title: Equipment inspection apparatus and equipment inspection method
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Application No.: US15334969Application Date: 2016-10-26
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Publication No.: US09886603B2Publication Date: 2018-02-06
- Inventor: Tsuyahiko Shimada
- Applicant: FUJITSU FRONTECH LIMITED
- Applicant Address: JP Tokyo
- Assignee: FUJITSU FRONTECH LIMITED
- Current Assignee: FUJITSU FRONTECH LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Main IPC: G06K7/10
- IPC: G06K7/10

Abstract:
A search table acquisition unit preliminarily acquires a search table, which is a list of RFID tags attached to items of equipment. A tag search unit searches for the RFID tags, a comparison processing unit compares an RFID tag having responded with tag information in the search table and, for an RFID tag which has become unresponsive, a re-search processing unit performs a process of disabling the double-read prevention function, thereby enabling the RFID tag to respond. Accordingly, it becomes possible to reliably inspect items of equipment provided properly.
Public/Granted literature
- US20170046543A1 EQUIPMENT INSPECTION APPARATUS AND EQUIPMENT INSPECTION METHOD Public/Granted day:2017-02-16
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