An image sensor may include an array of pixels arranged in rows and columns. Each pixel may include a floating diffusion node, a capacitor, a dual conversion gain (DCG) transistor having a gate terminal coupled to the floating diffusion, a source terminal, and a drain terminal coupled to the floating diffusion through the capacitor. Column readout circuitry may provide per-column control signals to the source terminal of the DCG transistor in the pixels of a selected row to place the pixels into a low conversion gain mode by turning the DCG transistor on and into a high conversion gain mode by turning the DCG transistor off. In this way, the readout circuitry may provide per-column conversion gains for each row without boosting DCG control signals to magnitudes greater than the pixel supply voltage, thereby reducing voltage stress on the pixel array and improving lifetime of the image sensor.