Invention Grant
- Patent Title: Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded
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Application No.: US14907009Application Date: 2014-06-30
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Publication No.: US09891042B2Publication Date: 2018-02-13
- Inventor: Yoshiharu Morimoto , Akihiro Masaya , Akifumi Takagi
- Applicant: 4D SENSOR INC.
- Applicant Address: JP Wakayama
- Assignee: 4D SENSOR INC.
- Current Assignee: 4D SENSOR INC.
- Current Assignee Address: JP Wakayama
- Agency: Staas & Halsey LLP
- International Application: PCT/JP2014/067420 WO 20140630
- International Announcement: WO2016/001986 WO 20160107
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/16 ; G06T7/246

Abstract:
A phase of a specific frequency is found by carrying out a two-dimensional Fourier transformation on an image of a two-dimensional grid image on the surface of an object taken by a camera, and the displacement of the surface of the object is measured from the phase. As a result, measurement that is strong against noise can be carried out without projecting a grid having a brightness distribution of precise cosine waves. In addition, the process is simple and the number of pixels used for the measurement is smaller than that in the sampling moire method. The displacement can be found at a high speed.
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