A simulation system for a current collecting surface of a C-shaped contact rail includes a double-headed rail and a limiting plate. A current collecting end surface of the double-headed rail has a same current collection area as an actual C-shaped contact rail. The limiting plate matches the inner contour of the C-shaped contact rail. A constructed test line can simulate the current collecting status of the C-shaped contact rail. The limiting plate and the existing double-headed rail are combined, and compared with reproduction of the C-shaped contact rail, the manufacturing cycle is short, the costs are low, and it is applicable to the test line.