Invention Grant
- Patent Title: Voltage detecting circuit and method for measuring characteristic of transistor
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Application No.: US14035016Application Date: 2013-09-24
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Publication No.: US09891265B2Publication Date: 2018-02-13
- Inventor: Tatsuya Hirose
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Kratz, Quintos & Hanson, LLP
- Priority: JP2012-256687 20121122
- Main IPC: G01R15/00
- IPC: G01R15/00 ; G01R31/26 ; G01R1/067 ; H01L21/00

Abstract:
A voltage detection circuit includes: a transistor; a switch coupled to a drain terminal of the transistor; the drain terminal is coupled to an one end of the switch; a first driver that controls the switch in synchronization with a second driver that drives a gate terminal of the transistor; and a plurality of resistors coupled in series and coupled to an another end of the switch.
Public/Granted literature
- US20140139206A1 VOLTAGE DETECTING CIRCUIT AND METHOD FOR MEASURING CHARACTERISTIC OF TRANSISTOR Public/Granted day:2014-05-22
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