Invention Grant
- Patent Title: Multi-bit flip-flops and scan chain circuits
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Application No.: US15281998Application Date: 2016-09-30
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Publication No.: US09891283B2Publication Date: 2018-02-13
- Inventor: Min-Su Kim , Matthew Berzins , Jong-Woo Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; H03K19/21 ; H03K3/037 ; G01R31/3185 ; H03K3/3562 ; G01R31/317

Abstract:
A multi-bit flip-flop includes a plurality of multi-bit flip-flop blocks that share a clock signal. Each of the multi-bit flip-flop blocks includes a single inverter and a plurality of flip-flops. The single inverter generates an inverted clock signal by inverting the clock signal. Each of the flip-flops includes a master latch part and a slave latch part and operates the master latch part and the slave latch part based on the clock signal and the inverted clock signal. Here, the flip-flops are triggered at rising edges of the clock signal. Thus, the multi-bit flip-flop operating as a master-slave flip-flop may minimize (or, reduce) power consumption occurring in a clock path through which the clock signal is transmitted.
Public/Granted literature
- US20170016955A1 MULTI-BIT FLIP-FLOPS AND SCAN CHAIN CIRCUITS Public/Granted day:2017-01-19
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