- Patent Title: Locally imaging a structure in a sample at high spatial resolution
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Application No.: US15271888Application Date: 2016-09-21
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Publication No.: US09891417B2Publication Date: 2018-02-13
- Inventor: Stefan W. Hell , Fabian Goettfert , Volker Westphal
- Applicant: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Applicant Address: DE Munich
- Assignee: MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V.
- Current Assignee: MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V.
- Current Assignee Address: DE Munich
- Agency: Thomas | Horstemeyer, LLP
- Priority: DE102015116023 20150922; DE102016104100 20160307
- Main IPC: F21V9/16
- IPC: F21V9/16 ; G02B21/00 ; G01N21/64 ; G02B21/16 ; G02B27/58

Abstract:
For high spatial resolution imaging a structure in a sample, the structure being marked with luminescence markers, light that has an effect on the emission of luminescence light by the luminescence markers is directed onto the sample with an intensity distribution having a zero point and intensity maxima neighboring the zero point in at least one direction. A scan area which is a part of the sample is scanned with the zero point. Luminescence light emitted out of a local area including the zero point is registered and assigned to the respective location of the zero point in the sample. Dimensions of the scan area, in at least one direction in which the intensity maxima are neighboring the zero point, are limited such that they are not larger than 75% of a distance of the intensity maxima in the at least one direction.
Public/Granted literature
- US20170082844A1 Locally Imaging a Structure in a Sample at High Spatial Resolution Public/Granted day:2017-03-23
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