Invention Grant
- Patent Title: Method for the correction of spherical aberration in microscopic applications
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Application No.: US14617094Application Date: 2015-02-09
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Publication No.: US09891423B2Publication Date: 2018-02-13
- Inventor: Thorsten Kues , Ralf Steinmeyer
- Applicant: Carl Zeiss Microscopy GmbH
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Patterson Thuente Pederson, P.A.
- Priority: DE102014003145 20140304
- Main IPC: G02B27/00
- IPC: G02B27/00 ; G02B21/36 ; H04N5/238

Abstract:
A procedure for the correction of spherical aberration in microscopic applications, wherein various recordings of a specimen to be observed are taken and evaluated for the purpose of changing the setting values of the optical system. The correction values are stored in a correction matrix as a function of the recording position, the recording time, the wavelength, and the temperature, wherein the determination and storage of the correction values are carried out in each recording position in the x, y, and z coordinates, and/or the correction values are determined after a selection of grid points by interpolation, so that the correction values of the interpolated correction matrix are the starting values for the subsequent exact determination by measurement.
Public/Granted literature
- US20150253562A1 METHOD FOR THE CORRECTION OF SPHERICAL ABERRATION IN MICROSCOPIC APPLICATIONS Public/Granted day:2015-09-10
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