Invention Grant
- Patent Title: Method of controlling adherence of microparticles to substrate to be processed, and processing apparatus
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Application No.: US14387654Application Date: 2012-11-07
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Publication No.: US09892951B2Publication Date: 2018-02-13
- Inventor: Takehiro Tanikawa , Kazuki Moyama
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JP2012-100213 20120425
- International Application: PCT/JP2012/078875 WO 20121107
- International Announcement: WO2013/161106 WO 20131031
- Main IPC: B08B9/00
- IPC: B08B9/00 ; H01L21/683 ; H01J37/32 ; C23C16/44 ; H01L21/3213

Abstract:
A method of controlling adherence of microparticles to a substrate to be processed includes applying voltage to an electrostatic chuck configured to electrostatically attract the substrate to be processed in a processing container before the substrate to be processed is carried into the processing container; and, after the applying of voltage to the electrostatic chuck, carrying the substrate to be processed into the processing container. Further, in the applying of voltage to the electrostatic chuck, the voltage is applied to the electrostatic chuck to reduce a potential difference between a focus ring and the substrate to be processed, the focus ring being provided to surround the electrostatic chuck.
Public/Granted literature
- US20150075566A1 METHOD OF CONTROLLING ADHERENCE OF MICROPARTICLES TO SUBSTRATE TO BE PROCESSED, AND PROCESSING APPARATUS Public/Granted day:2015-03-19
Information query
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