Invention Grant
- Patent Title: Semiconductor device comprising a gradually increasing field dielectric layer and method of manufacturing a semiconductor device
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Application No.: US15216889Application Date: 2016-07-22
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Publication No.: US09893158B2Publication Date: 2018-02-13
- Inventor: Andreas Meiser , Oliver Haeberlen
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Volpe and Koenig, P.C.
- Priority: DE102015112427 20150729
- Main IPC: H01L29/40
- IPC: H01L29/40 ; H01L29/66 ; H01L29/78 ; H01L21/3115 ; H01L29/417 ; H01L29/06 ; H01L29/10 ; H01L29/08

Abstract:
A semiconductor device is provided that includes a transistor in a semiconductor body having a main surface. The transistor includes a source region, a drain region, a body region, a drift zone, and a gate electrode at the body region. The body region and the drift zone are disposed along a first direction between the source region and the drain region. The first direction is parallel to the main surface. The semiconductor device further includes a field plate disposed in field plate trenches extending along the first direction in the drift zone, and a field dielectric layer between the field plate and the drift zone. A thickness of the field dielectric layer gradually increases along the first direction from a portion adjacent to the source region to a portion adjacent to the drain region.
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