Invention Grant
- Patent Title: Semiconductor device
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Application No.: US15273230Application Date: 2016-09-22
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Publication No.: US09893180B2Publication Date: 2018-02-13
- Inventor: Shuhei Mitani , Yuki Nakano , Heiji Watanabe , Takayoshi Shimura , Takuji Hosoi , Takashi Kirino
- Applicant: ROHM CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ROHM CO., LTD.
- Current Assignee: ROHM CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: Rabin & Berdo, P.C.
- Priority: JP2009-206372 20090907; JP2009-206373 20090907; JP2009-206374 20090907
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/02 ; H01L21/04 ; H01L21/82 ; H01L29/16 ; H01L29/417 ; H01L29/423 ; H01L29/51 ; H01L29/66 ; H01L29/10 ; H01L29/08 ; H01L29/45
Abstract:
A semiconductor device includes a semiconductor layer of a first conductivity type. A well region that is a second conductivity type well region is formed on a surface layer portion of the semiconductor layer and has a channel region defined therein. A source region that is a first conductivity type source region is formed on a surface layer portion of the well region. A gate insulating film is formed on the semiconductor layer and has a multilayer structure. A gate electrode is opposed to the channel region of the well region where a channel is formed through the gate insulating film.
Public/Granted literature
- US20170012123A1 SEMICONDUCTOR DEVICE Public/Granted day:2017-01-12
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