Invention Grant
- Patent Title: Image sensor with tolerance optimizing interconnects
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Application No.: US14875591Application Date: 2015-10-05
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Publication No.: US09907459B2Publication Date: 2018-03-06
- Inventor: Laurent Blanquart
- Applicant: Depuy Synthes Products, Inc.
- Applicant Address: US MA Raynham
- Assignee: DePuy Synthes Products, Inc.
- Current Assignee: DePuy Synthes Products, Inc.
- Current Assignee Address: US MA Raynham
- Agency: TechLaw Ventures, PLLC
- Agent Terrence J. Edwards
- Main IPC: H01L27/00
- IPC: H01L27/00 ; A61B1/05 ; H01L27/146 ; A61B1/00 ; H04N5/374 ; H04N5/3745 ; H04N5/378 ; H01L23/00 ; A61B1/06 ; H04N5/225 ; H01L31/028 ; H01L31/0296 ; H01L31/0304

Abstract:
Embodiments of a hybrid imaging sensor that optimizes a pixel array area on a substrate using a stacking scheme for placement of related circuitry with minimal vertical interconnects between stacked substrates and associated features are disclosed. Embodiments of maximized pixel array size/die size (area optimization) are disclosed, and an optimized imaging sensor providing improved image quality, improved functionality, and improved form factors for specific applications common to the industry of digital imaging are also disclosed. Embodiments of the above may include systems, methods and processes for staggering ADC or column circuit bumps in a column or sub-column hybrid image sensor using vertical interconnects are also disclosed.
Public/Granted literature
- US20160155765A1 IMAGE SENSOR WITH TOLERANCE OPTIMIZING INTERCONNECTS Public/Granted day:2016-06-02
Information query
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