Invention Grant
- Patent Title: Leakage determination method, leakage determination system, and program
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Application No.: US14431867Application Date: 2013-09-26
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Publication No.: US09909949B2Publication Date: 2018-03-06
- Inventor: Osamu Hoshuyama
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2012-218037 20120928
- International Application: PCT/JP2013/075973 WO 20130926
- International Announcement: WO2014/050923 WO 20140403
- Main IPC: G01M3/24
- IPC: G01M3/24 ; E03B7/00
Abstract:
The present invention is a leakage determination method comprising: comparing a correlation profile including a cross-correlation function obtained from measurement data measured at at least a pair of measurement positions and position information for the measurement positions, and a correlation profile at the time of the leakage determination including the cross-correlation function obtained from the measurement data measured at the pair of measurement positions and the position information for the measurement positions; and determining leakage.
Public/Granted literature
- US20150241297A1 LEAKAGE DETERMINATION METHOD, LEAKAGE DETERMINATION SYSTEM, AND PROGRAM Public/Granted day:2015-08-27
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