Invention Grant
- Patent Title: Force measurement with real-time baseline determination
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Application No.: US15438429Application Date: 2017-02-21
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Publication No.: US09910064B2Publication Date: 2018-03-06
- Inventor: Changchun Liu , Bede Pittenger , Shuiqing Hu , Chanmin Su
- Applicant: Bruker Nano, Inc.
- Applicant Address: US CA Santa Barbara
- Assignee: Bruker Nano, Inc.
- Current Assignee: Bruker Nano, Inc.
- Current Assignee Address: US CA Santa Barbara
- Agency: Boyle Fredrickson S.C.
- Main IPC: G01Q10/06
- IPC: G01Q10/06
Abstract:
An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.
Public/Granted literature
- US20170227577A1 Force Measurement with Real-Time Baseline Determination Public/Granted day:2017-08-10
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