A method for auto-calibrating a semiconductor component tester is provided. The semiconductor component tester includes a wafer tester or a package IC tester. Firstly, an initial tester setting value and an initial board setting value are acquired through a calibration board. Then, the test record of the semiconductor component corresponding to each test time and the tester parameter and the board parameter for testing the semiconductor component are recoded. If the semiconductor component fails the test, the semiconductor component is tested again according to the previously-passed tester parameter and the previously-passed board parameter, or the semiconductor component is tested again after the tester parameter and the board parameter are adjusted. The method is capable of correcting the improper test result from the improper tester parameter.