Invention Grant
- Patent Title: Alpha ray observation device and alpha ray observation method
-
Application No.: US15327717Application Date: 2015-07-23
-
Publication No.: US09910163B2Publication Date: 2018-03-06
- Inventor: Naoto Kume , Kei Takakura , Hidehiko Kuroda , Yukio Yoshimura
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-152438 20140725
- International Application: PCT/JP2015/070957 WO 20150723
- International Announcement: WO2016/013610 WO 20160128
- Main IPC: G01T1/167
- IPC: G01T1/167 ; G01T7/00

Abstract:
An alpha ray observation device and an alpha ray observation method are provided that can correctly evaluate a signal derived from alpha rays. The alpha ray observation device according to an embodiment includes a device housing 10, an incident window 2, a condenser 3, an optical path changer 4, and a first optical detector 5. The device housing 10 is provided with an opening. The incident window 2 is provided at the opening, and can block beta rays. Emitted light originated by alpha rays caused from the measurement object set outside of the device housing 10 enters the inside of the device housing 10 through the incident window 2 with beta rays being blocked, and is condensed by the condenser 3, and the optical path is changed by the optical path changer 4, and subsequently the light is detected by the first optical detector 5. The first optical detector 5 outputs a signal according to the amount of detected light.
Public/Granted literature
- US20170205513A1 ALPHA RAY OBSERVATION DEVICE AND ALPHA RAY OBSERVATION METHOD Public/Granted day:2017-07-20
Information query