Invention Grant
- Patent Title: Monitoring device, monitoring system and monitoring method
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Application No.: US14238087Application Date: 2011-08-29
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Publication No.: US09911041B2Publication Date: 2018-03-06
- Inventor: Masashi Koga
- Applicant: Masashi Koga
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- International Application: PCT/JP2011/069462 WO 20110829
- International Announcement: WO2013/030929 WO 20130307
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/00 ; G01B11/03 ; G06T11/60 ; H04W4/04

Abstract:
A monitoring device monitors facility elements in a building. Self-localization of the monitoring device is estimated by collating measured three-dimensional shapes with a map for localization including the shapes and positions of structural objects inside a building excluding the shapes and positions of facility elements. The monitoring device extracts the shape and position of a facility element candidate from the measured three-dimensional shapes; and calculates a similarity between the shape and position of each of the facility elements in the periphery of the self-localization extracted from the facility element collation map. The monitoring device identifies which of the facility elements in the periphery of the self-localization extracted from the facility element collation map is the facility element candidate extracted from the measured three-dimensional shape on the basis of the calculated similarity.
Public/Granted literature
- US20140168423A1 MONITORING DEVICE, MONITORING SYSTEM AND MONITORING METHOD Public/Granted day:2014-06-19
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