Invention Grant
- Patent Title: Integrated circuits with spacer chamfering and methods of spacer chamfering
-
Application No.: US15443522Application Date: 2017-02-27
-
Publication No.: US09911825B2Publication Date: 2018-03-06
- Inventor: Hui Zang
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Jacquelyn A Graff
- Main IPC: H01L27/088
- IPC: H01L27/088 ; H01L29/66 ; H01L29/78 ; H01L21/3213

Abstract:
Semiconductor devices and methods for forming the devices with spacer chamfering. One method includes, for instance: obtaining a wafer with at least one source, at least one drain, and at least one fin; forming at least one sacrificial gate with at least one barrier layer; forming a first set of spacers adjacent to the at least one sacrificial gate; forming at least one second set of spacers adjacent to the first set of spacers; and etching to remove a portion of the first set of spacers above the at least one barrier layer to form a widened opening. An intermediate semiconductor device is also disclosed.
Public/Granted literature
- US20170170293A1 INTEGRATED CIRCUITS WITH SPACER CHAMFERING AND METHODS OF SPACER CHAMFERING Public/Granted day:2017-06-15
Information query
IPC分类: