Invention Grant
- Patent Title: Capacitive silicon microphone and fabrication method thereof
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Application No.: US15033113Application Date: 2014-09-26
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Publication No.: US09913040B2Publication Date: 2018-03-06
- Inventor: Yuhang Zhao , Yong Wang , Xiaoxu Kang , Yan Chen
- Applicant: SHANGHAI IC R&D CENTER CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI IC R&D CENTER CO., LTD
- Current Assignee: SHANGHAI IC R&D CENTER CO., LTD
- Current Assignee Address: CN Shanghai
- Agency: Tianchen LLC.
- Priority: CN201310631540 20131129
- International Application: PCT/CN2014/087491 WO 20140926
- International Announcement: WO2015/078227 WO 20150604
- Main IPC: H04R7/20
- IPC: H04R7/20 ; H04R19/00 ; H04R19/04 ; H04R7/08 ; H04R31/00

Abstract:
A capacitive silicon microphone comprises: a first dielectric layer sets on a substrate with a back cavity, a lower polar plate which is located over the back cavity, a first elastic member of which an inner edge is connected with the edge of the lower polar plate and an outer edge is located on the upper surface of the first dielectric layer, a second dielectric layer which is located on the outer edge of the first elastic member and right above the first dielectric layer, an upper polar plate which has a plurality of release holes and is formed above the lower polar plate with an air gap in between, a second elastic member of which an inner edge is connected with the edge of the upper polar plate and an outer edge is located on the upper surface of the second dielectric layer.
Public/Granted literature
- US20160286317A1 CAPACITIVE SILICON MICROPHONE AND FABRICATION METHOD THEREOF Public/Granted day:2016-09-29
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