Invention Grant
- Patent Title: Ocular metrology employing spectral wavefront analysis of reflected light
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Application No.: US14899559Application Date: 2014-06-20
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Publication No.: US09913579B2Publication Date: 2018-03-13
- Inventor: Steven James Frisken , Grant Andrew Frisken
- Applicant: Cylite Pty Ltd
- Agent Darren Gardner
- Priority: AU2013902254 20130620
- International Application: PCT/AU2014/000637 WO 20140620
- International Announcement: WO2014/201503 WO 20141224
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/00 ; G01B9/02 ; G01J9/02 ; A61B3/117 ; A61B3/107 ; A61B3/14 ; G02B27/10 ; G02B27/28 ; G02C7/02

Abstract:
Method and systems are presented for analyzing a wavefront using a spectral wavefront analyzer to extract optical phase and spectral information at a two dimensional array of sampling points across the wavefront, wherein the relative phase information between the sampling points is maintained. Methods and systems are also presented for measuring an eye by reflecting a wavefront of an eye and measuring the wavefront at a plurality of angles to provide a map of the off-axis relative wavefront curvature and aberration of the eye. The phase accuracy between wavelengths and sample points over a beam aperture offered by these methods and systems have a number of ocular applications including corneal and anterior eye tomography, high resolution retinal imaging, and wavefront analysis as a function of probe beam incident angle for determining myopia progression and for designing and testing lenses for correcting myopia.
Public/Granted literature
- US20160135679A1 OCULAR METROLOGY EMPLOYING SPECTRAL WAVEFRONT ANALYSIS OF REFLECTED LIGHT Public/Granted day:2016-05-19
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