Invention Grant
- Patent Title: Method of detecting whether microelectromechanical system device is hermetic
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Application No.: US15093765Application Date: 2016-04-08
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Publication No.: US09915679B2Publication Date: 2018-03-13
- Inventor: Hsin-Hung Huang , Wei-Yang Ou , Hung-Sen Chen
- Applicant: SensorTek technology Corp.
- Applicant Address: TW Hsinchu County
- Assignee: SensorTek technology Corp.
- Current Assignee: SensorTek technology Corp.
- Current Assignee Address: TW Hsinchu County
- Agency: Winston Hsu
- Priority: TW105103664A 20160204
- Main IPC: G01P15/12
- IPC: G01P15/12 ; B81C99/00 ; G01P21/00 ; G01C19/5783 ; G01C25/00 ; G01P15/08 ; G01P15/125

Abstract:
A method of detecting whether a microelectromechanical system (MEMS) device is hermetic includes applying at least three voltage differences between a movable part and a sensor electrode of the MEMS device to measure at least three effective capacitances, calculating a capacitance-to-voltage curve and an offset voltage of the MEMS device according to the at least three effective capacitances; and determining whether the offset voltage is within a predetermined range to determine whether MEMS device is hermetic.
Public/Granted literature
- US20170227575A1 Method of Detecting Whether Microelectromechanical System Device Is Hermetic Public/Granted day:2017-08-10
Information query
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