Invention Grant
- Patent Title: Inspection systems with two X-ray scanners in a first stage inspection system
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Application No.: US14684089Application Date: 2015-04-10
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Publication No.: US09915752B2Publication Date: 2018-03-13
- Inventor: Kristian R. Peschmann
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01V5/00 ; G01N23/223 ; G01N23/20

Abstract:
This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.
Public/Granted literature
- US20160025888A1 Methods and Systems for the Rapid Detection of Concealed Objects Public/Granted day:2016-01-28
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