A method for testing an application running on an electronic device includes parsing, by a test processor, a state model of the application representing relationships among a plurality nodes, each node representing an application state. The method further includes parsing, by the test processor, a test implementation file including a plurality of commands for manipulating at least one of the application and the electronic device, each of the plurality of commands associated with respective ones of the plurality of nodes, traversing, by the test processor, the state model of the application by selecting for testing an application node in accordance with the node relationships in the state model. The method also includes selecting, by the test processor, one or more of the plurality of commands for testing the application based on at least one criteria, and executing, by the test processor, the one or more selected commands.