Invention Grant
- Patent Title: Apparatus and method for generating test cases for processor verification, and verification device
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Application No.: US14920548Application Date: 2015-10-22
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Publication No.: US09916414B2Publication Date: 2018-03-13
- Inventor: Seong-Hoon Jeong , Moo-Kyoung Chung , Young-Chul Cho , Hee-Jun Shim , Jin-Sae Jung , Yen-Jo Han
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2013-0044434 20130422
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/36
Abstract:
An apparatus for generating a test case includes a constrained description generator configured to define a plurality of constrained verification spaces in a total verification space, and generate a constrained description for each of the plurality of constrained verification spaces; and a test case generator configured to generate a test case using the constrained description.
Public/Granted literature
- US20160042116A1 APPARATUS AND METHOD FOR GENERATING TEST CASES FOR PROCESSOR VERIFICATION, AND VERIFICATION DEVICE Public/Granted day:2016-02-11
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