Invention Grant
- Patent Title: Ion injector and lens system for ion beam milling
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Application No.: US15191176Application Date: 2016-06-23
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Publication No.: US09916993B2Publication Date: 2018-03-13
- Inventor: Ivan L. Berry, III , Thorsten Lill
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: C03C25/68
- IPC: C03C25/68 ; H01L21/67 ; H01L21/3065 ; H01J37/32

Abstract:
The embodiments herein relate to methods and apparatus for performing ion etching on a semiconductor substrate, as well as methods for forming such apparatus. In some embodiments, an electrode assembly may be fabricated, the electrode assembly including a plurality of electrodes having different purposes, with each electrode secured to the next in a mechanically stable manner. Apertures may be formed in each electrode after the electrodes are secured together, thereby ensuring that the apertures are well-aligned between neighboring electrodes. In some cases, the electrodes are made from degeneratively doped silicon, and the electrode assembly is secured together through electrostatic bonding. Other electrode materials and methods of securing may also be used. The electrode assembly may include a hollow cathode emitter electrode in some cases, which may have a frustoconical or other non-cylindrical aperture shape. A chamber liner and/or reflector may also be present in some cases.
Public/Granted literature
- US20160307781A1 ION INJECTOR AND LENS SYSTEM FOR ION BEAM MILLING Public/Granted day:2016-10-20
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