According to one embodiment of the disclosure, a system monitors a first metric associated with a host device. The system accesses, at a monitoring frequency, data associated with the first metric. The system determines, based on the data, a metric rating for the first metric. The system further determines, based on the metric rating, whether the metric rating is above a threshold. The system modifies, based at least in part on the metric rating being above the threshold, a monitoring behavior of a probe.