Invention Grant
- Patent Title: Systems and methods for measuring scene information while capturing images using array cameras
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Application No.: US14773748Application Date: 2014-03-07
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Publication No.: US09917998B2Publication Date: 2018-03-13
- Inventor: Kartik Venkataraman , Florian Ciurea
- Applicant: FotoNation Cayman Limited
- Applicant Address: US CA San Jose
- Assignee: FotoNation Cayman Limited
- Current Assignee: FotoNation Cayman Limited
- Current Assignee Address: US CA San Jose
- Agency: KPPB LLP
- International Application: PCT/US2014/022118 WO 20140307
- International Announcement: WO2014/138695 WO 20140912
- Main IPC: H04N5/225
- IPC: H04N5/225 ; H04N5/235 ; H04N5/355 ; H04N5/232 ; H04N5/265 ; H04N5/33 ; H04N9/09

Abstract:
Systems and methods for measuring scene information while capturing images using array cameras in accordance with embodiments of the invention are disclosed. In one embodiment, a method of measuring scene information while capturing an image using an array camera includes defining at least two subsets of active cameras, configuring the active cameras using image capture settings, capturing image data using the active cameras, synthesizing at least one image using image data captured by a first subset of active cameras, measuring scene information using image data captured by a second subset of active cameras, and determining whether the image capture settings satisfy at least one predetermined criterion for at least one image capture parameter using the measured scene information, where new image capture settings are determined and utilized to configure the active cameras upon a determination that the image capture settings do not satisfy the at least one predetermined criterion.
Public/Granted literature
- US20160044257A1 Systems and Methods for Measuring Scene Information While Capturing Images Using Array Cameras Public/Granted day:2016-02-11
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