Invention Grant
- Patent Title: On-chip calibration system and method for infrared sensor
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Application No.: US15174483Application Date: 2016-06-06
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Publication No.: US09921110B2Publication Date: 2018-03-20
- Inventor: Walter B. Meinel , Kalin Lazarov
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Charles A. Brill; Frank D. Cimino
- Main IPC: G01J5/12
- IPC: G01J5/12 ; G01J5/22 ; G01J5/00

Abstract:
A radiation sensor includes an integrated circuit radiation sensor chip (1A) including first (7) and second (8) thermopile junctions connected in series to form a thermopile (7,8) within a dielectric stack (3). The first thermopile junction (7) is insulated from a substrate (2) of the chip. A resistive heater (6) in the dielectric stack for heating the first thermopile junction is coupled to a calibration circuit (67) for calibrating responsivity of the thermopile (7,8). The calibration circuit causes a current flow in the heater and multiplies the current by a resulting voltage across the heater to determine power dissipation. A resulting thermoelectric voltage (Vout) of the thermopile (7,8) is divided by the power to provide the responsivity of the sensor.
Public/Granted literature
- US20160282189A1 ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR Public/Granted day:2016-09-29
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