Invention Grant
- Patent Title: Systems and methods for built-in self test of low dropout regulators
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Application No.: US15476062Application Date: 2017-03-31
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Publication No.: US09933802B1Publication Date: 2018-04-03
- Inventor: Jae Woong Jeong , Ender Yilmaz , LeRoy Winemberg
- Applicant: NXP USA, Inc.
- Applicant Address: US TX Austin
- Assignee: NXP USA, Inc.
- Current Assignee: NXP USA, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G05F1/575
- IPC: G05F1/575 ; G01R31/28 ; G05F5/00 ; G01R31/30 ; G01R31/40
Abstract:
A low dropout regulator (LDO) system includes a first pseudo random binary sequence (PRBS) generator configured to output a first PRBS signal; an LDO configured to output an LDO output signal and having an error amplifier, wherein the first PRBS generator is coupled to an input of the error amplifier; a second PRBS generator configured to output a second PRBS signal; and a correlator coupled to the LDO and second PRBS generator and configured to correlate the LDO output signal with the second PRBS signal to provide an impulse response data sample of the LDO.
Information query
IPC分类:
