Invention Grant
- Patent Title: Method for manufacturing a semiconductor device
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Application No.: US15469454Application Date: 2017-03-24
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Publication No.: US09935235B2Publication Date: 2018-04-03
- Inventor: Tadashi Yamaguchi
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2016-092276 20160502
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L31/18 ; H01L31/109 ; H01L31/103 ; H01L31/0224

Abstract:
The performances of a semiconductor device are improved. A method for manufacturing a semiconductor device includes the steps of: providing a semiconductor substrate having a gettering layer formed by ion implanting a cluster, and an epitaxial layer; subjecting the semiconductor substrate to a heat treatment at 800° C. or more, and thereby forming a hydrogen adsorption site; forming an element isolation film at the semiconductor substrate, to be performed thereafter; implanting an impurity for forming a first semiconductor region in the semiconductor substrate; implanting an impurity for forming a second semiconductor region; and performing a heat treatment for a photodiode, to be performed thereafter.
Public/Granted literature
- US20170317226A1 METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE Public/Granted day:2017-11-02
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