Invention Grant
- Patent Title: Methods and systems for averaging impedance calibration
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Application No.: US15654499Application Date: 2017-07-19
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Publication No.: US09935632B1Publication Date: 2018-04-03
- Inventor: Dean D. Gans
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: H03K19/00
- IPC: H03K19/00 ; G11C11/4093 ; H03K19/0175 ; G11C11/4094 ; G11C29/02 ; H03K19/003
Abstract:
A semiconductor device includes a power management integrated circuit that supplies a periodic supply voltage signal. The semiconductor device also includes programmable termination components and a calibration circuit. The calibration circuit generates impedance calibration codes associated with a period of the periodic supply voltage signal. The calibration circuit also calibrates impedance of the programmable termination components based on an average impedance calibration code of the impedance calibration codes. The semiconductor device further includes an averaging circuit that determines the average impedance calibration code of the impedance calibration codes.
Information query
