Invention Grant
- Patent Title: Method and system to measure the phase offset based on the frequency response in a NFC system
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Application No.: US15225767Application Date: 2016-08-01
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Publication No.: US09935689B2Publication Date: 2018-04-03
- Inventor: Gernot Hueber , Ian Thomas Macnamara , Johannes Bruckbauer , Hubert Watzinger
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Main IPC: H04B5/00
- IPC: H04B5/00 ; H04B17/21 ; H04B17/318

Abstract:
The present invention provides for a method and system for compensating phase offset caused by a matching network and antenna of a communications device. The method comprises: generating a mapping that correlates phase offset with a characteristic parameter; measuring the characteristic parameter for the communications device; using the measured characteristic parameter and the mapping to determine a phase offset for the communications device; and using the determined phase offset to compensate for the phase offset caused by the matching network and antenna of the communications device. The present invention also provides for a method and system for measuring a phase offset caused by a matching network and antenna of a communications device.
Public/Granted literature
- US20180034510A1 METHOD AND SYSTEM TO MEASURE THE PHASE OFFSET BASED ON THE FREQUENCY RESPONSE IN A NFC SYSTEM Public/Granted day:2018-02-01
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